National Vulnerability Database

National Vulnerability Database

NVD

  1. Vulnerabilities

CVE-2018-13899 Detail

Current Description

Processing messages after error may result in user after free memory fault in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Consumer IOT, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables in MDM9150, MDM9206, MDM9607, MDM9650, MSM8909W, QCS605, Qualcomm 215, SD 425, SD 439 / SD 429, SD 450, SD 625, SD 632, SD 636, SD 675, SD 712 / SD 710 / SD 670, SD 820, SD 820A, SD 845 / SD 850, SD 855, SDA660, SDM439, SDM630, SDM660, SDX20, SDX24, SM7150


View Analysis Description

Severity

 


CVSS 3.x Severity and Metrics:

NIST CVSS score
NIST: NVD
Base Score:  7.8 HIGH
Vector:  CVSS:3.0/AV:L/AC:L/PR:L/UI:N/S:U/C:H/I:H/A:H


NVD Analysts use publicly available information to associate vector strings and CVSS scores. We also display any CVSS information provided within the CVE List from the CNA.

Note: NVD Analysts have published a CVSS score for this CVE based on publicly available information at the time of analysis. The CNA has not provided a score within the CVE List.

References to Advisories, Solutions, and Tools

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Hyperlink Resource
https://www.codeaurora.org/security-bulletin/2019/04/01/april-2019-code-aurora-security-bulletin Patch  Third Party Advisory 

Weakness Enumeration

CWE-ID CWE Name Source
CWE-416 Use After Free cwe source acceptance level NIST  

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Change History

2 change records found show changes

Quick Info

CVE Dictionary Entry:
CVE-2018-13899
NVD Published Date:
05/24/2019
NVD Last Modified:
05/29/2019
Source:
Qualcomm, Inc.