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National Vulnerability Database

National Vulnerability Database

NVD

National Vulnerability Database
  1. Vulnerabilities

CVE-2022-25696 Detail

Description

Memory corruption in display due to time-of-check time-of-use race condition during map or unmap in Snapdragon Auto, Snapdragon Compute, Snapdragon Connectivity, Snapdragon Industrial IOT, Snapdragon Mobile, Snapdragon Wearables


Metrics

 
NVD enrichment efforts reference publicly available information to associate vector strings. CVSS information contributed by other sources is also displayed.
CVSS 4.0 Severity and Vector Strings:

NIST CVSS score
NIST: NVD
N/A
NVD assessment not yet provided.

References to Advisories, Solutions, and Tools

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Hyperlink Resource
https://www.qualcomm.com/company/product-security/bulletins/september-2022-bulletin Vendor Advisory 

Weakness Enumeration

CWE-ID CWE Name Source
CWE-367 Time-of-check Time-of-use (TOCTOU) Race Condition cwe source acceptance level NIST  

Known Affected Software Configurations Switch to CPE 2.2

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Change History

3 change records found show changes

Quick Info

CVE Dictionary Entry:
CVE-2022-25696
NVD Published Date:
09/16/2022
NVD Last Modified:
04/19/2023
Source:
Qualcomm, Inc.