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National Vulnerability Database

National Vulnerability Database

NVD

National Vulnerability Database
  1. Vulnerabilities

CVE-2025-30420 Detail

Description

There is a memory corruption vulnerability due to an out of bounds read in Bitmap::InternalDraw() when using the SymbolEditor in NI Circuit Design Suite.  This vulnerability may result in information disclosure or arbitrary code execution. Successful exploitation requires an attacker to get a user to open a specially crafted .sym file. This vulnerability affects NI Circuit Design Suite 14.3.0 and prior versions.


Metrics

 
NVD enrichment efforts reference publicly available information to associate vector strings. CVSS information contributed by other sources is also displayed.
CVSS 4.0 Severity and Vector Strings:

NIST CVSS score
NIST: NVD
N/A
NVD assessment not yet provided.

Nist CVSS score does not match with CNA score
CNA:  National Instruments
CVSS-B 8.5 HIGH
Vector:  CVSS:4.0/AV:L/AC:L/AT:N/PR:N/UI:P/VC:H/VI:H/VA:H/SC:N/SI:N/SA:N

References to Advisories, Solutions, and Tools

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URL Source(s) Tag(s)
https://www.ni.com/en/support/security/available-critical-and-security-updates-for-ni-software/memory-corruption-vulnerabilities-in-ni-circuit-design-suite.html National Instruments Vendor Advisory 

Weakness Enumeration

CWE-ID CWE Name Source
CWE-125 Out-of-bounds Read cwe source acceptance level NIST   National Instruments  

Known Affected Software Configurations Switch to CPE 2.2

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Change History

2 change records found show changes

Quick Info

CVE Dictionary Entry:
CVE-2025-30420
NVD Published Date:
05/15/2025
NVD Last Modified:
05/20/2025
Source:
National Instruments