CVE-2018-11264 Detail
Modified
This vulnerability has been modified since it was last analyzed by the NVD. It is awaiting reanalysis which may result in further changes to the information provided. DescriptionPossible buffer overflow in Ontario fingerprint code due to lack of input validation for the parameters coming into TZ from HLOS in Snapdragon Automobile, Snapdragon Mobile and Snapdragon Wear in versions MDM9206, MDM9607, MDM9650, MSM8996AU, SD 210/SD 212/SD 205, SD 410/12, SD 425, SD 430, SD 450, SD 625, SD 650/52, SD 820, SD 820A, SD 835, SDA660. Metrics
NVD enrichment efforts reference publicly available information to associate
vector strings. CVSS information contributed by other sources is also
displayed.
CVSS 4.0 Severity and Vector Strings:
References to Advisories, Solutions, and ToolsBy selecting these links, you will be leaving NIST webspace. We have provided these links to other web sites because they may have information that would be of interest to you. No inferences should be drawn on account of other sites being referenced, or not, from this page. There may be other web sites that are more appropriate for your purpose. NIST does not necessarily endorse the views expressed, or concur with the facts presented on these sites. Further, NIST does not endorse any commercial products that may be mentioned on these sites. Please address comments about this page to nvd@nist.gov.
Weakness Enumeration
Known Affected Software Configurations Switch to CPE 2.2CPEs loading, please wait.
Denotes Vulnerable Software Quick InfoCVE Dictionary Entry:CVE-2018-11264 NVD Published Date: 11/28/2018 NVD Last Modified: 11/20/2024 Source: Qualcomm, Inc. |